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Nanoscale characterisation of semiconductors by cathodolumi..:
Thonke, K
;
Tischer, I
;
Hocker, M
...
IOP Conference Series: Materials Science and Engineering. 55 (2014) - p. 012018 , 2014
Link:
https://doi.org/10.1088/1757-899x/55/1/012018
RT Journal T1 <Title>Nanoscale characterisation of semiconductors by cathodoluminescence</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_55_1_012018&Exemplar=1&LAN=DE A1 Thonke, K A1 Tischer, I A1 Hocker, M A1 Schirra, M A1 Fujan, K A1 Wiedenmann, M A1 Schneider, R A1 Frey, M A1 Feneberg, M PB IOP Publishing YR 2014 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 55 SP 012018 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/55/1/012018 DO https://doi.org/10.1088/1757-899x/55/1/012018 SF ELIB - SuUB Bremen
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