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1 Ergebnisse
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Approximate Yield Estimation of Correlated Failure Events f..:
Sun, Zhongmao
;
Huang, Shuaibo
;
Yan, Hao
IOP Conference Series: Materials Science and Engineering. 565 (2019) 1 - p. 012008 , 2019
Link:
https://doi.org/10.1088/1757-899x/565/1/012008
RT Journal T1 <Title>Approximate Yield Estimation of Correlated Failure Events for Near-threshold SRAM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_565_1_012008&Exemplar=1&LAN=DE A1 Sun, Zhongmao A1 Huang, Shuaibo A1 Yan, Hao PB IOP Publishing YR 2019 SN 1757-8981 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 565 IS 1 SP 012008 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/565/1/012008 DO https://doi.org/10.1088/1757-899x/565/1/012008 SF ELIB - SuUB Bremen
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