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Single-Crystal X-Ray Structural Analysis and Electronic Str..:

Huy, Bui Quoc ; Ishii, Tomohiko ; Taniguchi, Norito..
IOP Conference Series: Materials Science and Engineering.  835 (2020)  1 - p. 012015 , 2020
Link: https://doi.org/10.1088/1757-899x/835/1/012015