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Single Crystal X-ray Structural Analysis and Electronic The..:

Taniguchi, Norito ; Ishii, Tomohiko ; Huy, Bui Quoc.
IOP Conference Series: Materials Science and Engineering.  835 (2020)  1 - p. 012023 , 2020
Link: https://doi.org/10.1088/1757-899x/835/1/012023