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Measurements of the quantitative analytical depth resolutio..:
Berger, D
;
Nissen, J
IOP Conference Series: Materials Science and Engineering. 891 (2020) - p. 012004 , 2020
Link:
https://doi.org/10.1088/1757-899x/891/1/012004
RT Journal T1 <Title>Measurements of the quantitative analytical depth resolution at evaporated aluminium- and silver-layers with the FEG-EPMA JEOL JXA-8530F</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_891_1_012004&Exemplar=1&LAN=DE A1 Berger, D A1 Nissen, J PB IOP Publishing YR 2020 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 891 SP 012004 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/891/1/012004 DO https://doi.org/10.1088/1757-899x/891/1/012004 SF ELIB - SuUB Bremen
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