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1 Ergebnisse
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High-resolution x-ray diffraction of epitaxial bismuth chal..:
Holý, V
;
Kriegner, D
;
Steiner, H
...
Advances in Natural Sciences: Nanoscience and Nanotechnology. 8 (2017) 1 - p. 015006 , 2017
Link:
https://doi.org/10.1088/2043-6254/aa5953
RT Journal T1 <Title>High-resolution x-ray diffraction of epitaxial bismuth chalcogenide topological insulator layers</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_2043-6254_aa5953&Exemplar=1&LAN=DE A1 Holý, V A1 Kriegner, D A1 Steiner, H A1 Stangl, J A1 Bauer, G A1 Springholz, G PB IOP Publishing YR 2017 SN 2043-6262 JF Advances in Natural Sciences: Nanoscience and Nanotechnology VO 8 IS 1 SP 015006 LK http://dx.doi.org/https://doi.org/10.1088/2043-6254/aa5953 DO https://doi.org/10.1088/2043-6254/aa5953 SF ELIB - SuUB Bremen
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