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Linearizing the vertical scale of an interferometric micros..:
Germer, Thomas A
;
Renegar, T Brian
;
Griesmann, Ulf
.
Surface Topography: Metrology and Properties. 12 (2024) 2 - p. 025012 , 2024
Link:
https://doi.org/10.1088/2051-672x/ad44bb
RT Journal T1
Linearizing the vertical scale of an interferometric microscope and its effect on step-height measurement
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_2051-672x_ad44bb&Exemplar=1&LAN=DE A1 Germer, Thomas A A1 Renegar, T Brian A1 Griesmann, Ulf A1 Soons, Johannes A PB IOP Publishing YR 2024 SN 2051-672X JF Surface Topography: Metrology and Properties VO 12 IS 2 SP 025012 LK http://dx.doi.org/https://doi.org/10.1088/2051-672x/ad44bb DO https://doi.org/10.1088/2051-672x/ad44bb SF ELIB - SuUB Bremen
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