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Advancing electron microscopy using deep learning:
Chen, K
;
Barnard, A S
Journal of Physics: Materials. 7 (2024) 2 - p. 022001 , 2024
Link:
https://doi.org/10.1088/2515-7639/ad229b
RT Journal T1 <Title>Advancing electron microscopy using deep learning</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_2515-7639_ad229b&Exemplar=1&LAN=DE A1 Chen, K A1 Barnard, A S PB IOP Publishing YR 2024 SN 2515-7639 JF Journal of Physics: Materials VO 7 IS 2 SP 022001 LK http://dx.doi.org/https://doi.org/10.1088/2515-7639/ad229b DO https://doi.org/10.1088/2515-7639/ad229b SF ELIB - SuUB Bremen
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