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1 Ergebnisse
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Improving the reliability of conductive atomic force micros..:
Sumaiya, Saima A
;
Martini, Ashlie
;
Baykara, Mehmet Z
Nano Express. 1 (2020) 3 - p. 030023 , 2020
Link:
https://doi.org/10.1088/2632-959x/abcae0
RT Journal T1
Improving the reliability of conductive atomic force microscopy-based electrical contact resistance measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_2632-959x_abcae0&Exemplar=1&LAN=DE A1 Sumaiya, Saima A A1 Martini, Ashlie A1 Baykara, Mehmet Z PB IOP Publishing YR 2020 SN 2632-959X JF Nano Express VO 1 IS 3 SP 030023 LK http://dx.doi.org/https://doi.org/10.1088/2632-959x/abcae0 DO https://doi.org/10.1088/2632-959x/abcae0 SF ELIB - SuUB Bremen
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