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Achieving High Reliability in Histology: An Improvement Ser..:
Heher, Yael K.
;
Chen, Yigu
;
Pyatibrat, Sergey
...
American Journal of Clinical Pathology. 146 (2016) 5 - p. 554-560 , 2016
Link:
https://doi.org/10.1093/ajcp/aqw148
RT Journal T1 <Title>Achieving High Reliability in Histology: An Improvement Series to Reduce Errors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_ajcp_aqw148&Exemplar=1&LAN=DE A1 Heher, Yael K. A1 Chen, Yigu A1 Pyatibrat, Sergey A1 Yoon, Edward A1 Goldsmith, Jeffrey D. A1 Sands, Kenneth E. PB Oxford University Press (OUP) YR 2016 SN 0002-9173 SN 1943-7722 JF American Journal of Clinical Pathology VO 146 IS 5 SP 554 OP 560 LK http://dx.doi.org/https://doi.org/10.1093/ajcp/aqw148 DO https://doi.org/10.1093/ajcp/aqw148 SF ELIB - SuUB Bremen
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