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Scheduling Power-Constrained Tests through the SoC Function..:
HUSSIN, F. A.
;
YONEDA, T.
;
ORAILOGLU, A.
.
IEICE Transactions on Information and Systems. E91-D (2008) 3 - p. 736-746 , 2008
Link:
https://doi.org/10.1093/ietisy/e91-d.3.736
RT Journal T1 <Title>Scheduling Power-Constrained Tests through the SoC Functional Bus</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_ietisy_e91-d.3.736&Exemplar=1&LAN=DE A1 HUSSIN, F. A. A1 YONEDA, T. A1 ORAILOGLU, A. A1 FUJIWARA, H. PB Institute of Electronics, Information and Communications Engineers (IEICE) YR 2008 SN 0916-8532 SN 1745-1361 JF IEICE Transactions on Information and Systems VO E91-D IS 3 SP 736 OP 746 LK http://dx.doi.org/https://doi.org/10.1093/ietisy/e91-d.3.736 DO https://doi.org/10.1093/ietisy/e91-d.3.736 SF ELIB - SuUB Bremen
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