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From the physics of secondary electron emission to image co..:
Cazaux, J.
Journal of Electron Microscopy. 61 (2012) 5 - p. 261-284 , 2012
Link:
https://doi.org/10.1093/jmicro/dfs048
RT Journal T1 <Title>From the physics of secondary electron emission to image contrasts in scanning electron microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_jmicro_dfs048&Exemplar=1&LAN=DE A1 Cazaux, J. PB Oxford University Press (OUP) YR 2012 SN 0022-0744 SN 1477-9986 JF Journal of Electron Microscopy VO 61 IS 5 SP 261 OP 284 LK http://dx.doi.org/https://doi.org/10.1093/jmicro/dfs048 DO https://doi.org/10.1093/jmicro/dfs048 SF ELIB - SuUB Bremen
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