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1 Ergebnisse
1
1S-A1-2Innovate Electron Beam by GaN Semiconductor Photocat..:
Nishitani, Tomohiro
;
Narita, Akihiro
;
Tomita, Takeshi
...
Microscopy. 66 (2017) suppl_1 - p. i6-i6 , 2017
Link:
https://doi.org/10.1093/jmicro/dfx041
RT Journal T1
1S-A1-2Innovate Electron Beam by GaN Semiconductor Photocathodes Conducive to Single Shot Imaging
UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_jmicro_dfx041&Exemplar=1&LAN=DE A1 Nishitani, Tomohiro A1 Narita, Akihiro A1 Tomita, Takeshi A1 Kitamura, Shin-ichi A1 Meguro, Takashi A1 Iijima, Hokuto A1 Fuchi, Shingo A1 Tabuchi, Masao A1 Honda, Yoshio A1 Amano, Hiroshi PB Oxford University Press (OUP) YR 2017 SN 2050-5698 SN 2050-5701 JF Microscopy VO 66 IS suppl_1 SP i6 OP i6 LK http://dx.doi.org/https://doi.org/10.1093/jmicro/dfx041 DO https://doi.org/10.1093/jmicro/dfx041 SF ELIB - SuUB Bremen
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