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1 Ergebnisse
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Observation of Focused Ion Beam-Induced Artifacts in Transm..:
Cummings, Damion P
;
Perry, Daniel L
;
Jauregui, Luis Jose
...
Microscopy and Microanalysis. 29 (2022) 1 - p. 138-144 , 2022
Link:
https://doi.org/10.1093/micmic/ozac008
RT Journal T1
Observation of Focused Ion Beam-Induced Artifacts in Transmission Electron Microscopy Samples Leading to the Epitaxial Growth of AlGaSb Quantum Dots on the GaSb Substrate
UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozac008&Exemplar=1&LAN=DE A1 Cummings, Damion P A1 Perry, Daniel L A1 Jauregui, Luis Jose A1 Deitz, Julia A1 Klem, John F A1 Pan, Wei A1 Lu, Ping PB Oxford University Press (OUP) YR 2022 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS 1 SP 138 OP 144 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozac008 DO https://doi.org/10.1093/micmic/ozac008 SF ELIB - SuUB Bremen
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