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1 Ergebnisse
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Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:
Huth, M
;
Eckert, B
;
Aschauer, S
...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 401-402 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.188
RT Journal T1 <Title>Combine 4D STEM and EELS Using a Fast Pixelated Direct Detector with Center Hole</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.188&Exemplar=1&LAN=DE A1 Huth, M A1 Eckert, B A1 Aschauer, S A1 Hedley, E A1 Nellist, P A1 Majewski, P A1 Strüder, L A1 Soltau, H PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 401 OP 402 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.188 DO https://doi.org/10.1093/micmic/ozad067.188 SF ELIB - SuUB Bremen
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