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Artifact Elimination in Ultrafast Electron Microscopy:
Reisbick, Spencer A
;
Zhu, Yimei
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 435-436 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.206
RT Journal T1 <Title>Artifact Elimination in Ultrafast Electron Microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.206&Exemplar=1&LAN=DE A1 Reisbick, Spencer A A1 Zhu, Yimei PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 435 OP 436 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.206 DO https://doi.org/10.1093/micmic/ozad067.206 SF ELIB - SuUB Bremen
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