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1 Ergebnisse
1
Progress in Secondary Electron Yield Mapping in Charged Par..:
Agarwal, Akshay
;
Kasaei, Leila
;
Schultz, Albert
..
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 741-742 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.365
RT Journal T1
Progress in Secondary Electron Yield Mapping in Charged Particle Microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.365&Exemplar=1&LAN=DE A1 Agarwal, Akshay A1 Kasaei, Leila A1 Schultz, Albert A1 Feldman, Leonard C A1 Goyal, Vivek PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 741 OP 742 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.365 DO https://doi.org/10.1093/micmic/ozad067.365 SF ELIB - SuUB Bremen
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