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Using Realistic Valence Electron Wave Functions in 4D-STEM ..:
Oxley, Mark P
;
Lou, Wei
;
Yoon, M
.
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 743-744 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.366
RT Journal T1 <Title>Using Realistic Valence Electron Wave Functions in 4D-STEM Simulations</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.366&Exemplar=1&LAN=DE A1 Oxley, Mark P A1 Lou, Wei A1 Yoon, M A1 Chi, M PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 743 OP 744 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.366 DO https://doi.org/10.1093/micmic/ozad067.366 SF ELIB - SuUB Bremen
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