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In Operando Transmission Electron Microscopy Studies on Dif..:
Mahalingam, Krishnamurthy
;
Shallcross, Austin
;
Bowers, Cynthia T
...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 1611-1612 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.827
RT Journal T1
In Operando Transmission Electron Microscopy Studies on Diffusion-Induced Phenomena at Dielectric-Electrode Interfaces in Ge2Te3-Based Memristor Devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.827&Exemplar=1&LAN=DE A1 Mahalingam, Krishnamurthy A1 Shallcross, Austin A1 Bowers, Cynthia T A1 Winner, Derek A1 Hilton, Albert A1 Ganguli, Sabyasachi A1 Shin, Eunsung A1 Subramanyam, Guru PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 1611 OP 1612 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.827 DO https://doi.org/10.1093/micmic/ozad067.827 SF ELIB - SuUB Bremen
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