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1 Ergebnisse
1
High Resolution Scanning Transmission Electron Microscopy (..:
Balog, Andrew R
;
Miao, Leixin
;
Bachu, Saiphaneendra
...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 1779-1780 , 2023
Link:
https://doi.org/10.1093/micmic/ozad067.921
RT Journal T1
High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation Of Common Defects In Scandium and Aluminum Alloyed β-Ga2O3
UL https://suche.suub.uni-bremen.de/peid=cr-10.1093_micmic_ozad067.921&Exemplar=1&LAN=DE A1 Balog, Andrew R A1 Miao, Leixin A1 Bachu, Saiphaneendra A1 Jesenovec, Jani A1 Dutton, Benjamin A1 McCloy, John A1 Alem, Nasim PB Oxford University Press (OUP) YR 2023 SN 1431-9276 SN 1435-8115 JF Microscopy and Microanalysis VO 29 IS Supplement_1 SP 1779 OP 1780 LK http://dx.doi.org/https://doi.org/10.1093/micmic/ozad067.921 DO https://doi.org/10.1093/micmic/ozad067.921 SF ELIB - SuUB Bremen
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