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1 Ergebnisse
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Risk Factors Associated With Psychiatric Readmission:
Lorine, Kim
;
Goenjian, Haig
;
Kim, Soeun
...
Journal of Nervous & Mental Disease. 203 (2015) 6 - p. 425-430 , 2015
Link:
https://doi.org/10.1097/nmd.0000000000000305
RT Journal T1 <Title>Risk Factors Associated With Psychiatric Readmission</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1097_nmd.0000000000000305&Exemplar=1&LAN=DE A1 Lorine, Kim A1 Goenjian, Haig A1 Kim, Soeun A1 Steinberg, Alan M. A1 Schmidt, Kendall A1 Goenjian, Armen K. PB Ovid Technologies (Wolters Kluwer Health) YR 2015 SN 0022-3018 JF Journal of Nervous & Mental Disease VO 203 IS 6 SP 425 OP 430 LK http://dx.doi.org/https://doi.org/10.1097/nmd.0000000000000305 DO https://doi.org/10.1097/nmd.0000000000000305 SF ELIB - SuUB Bremen
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