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1 Ergebnisse
1
Analysis of Electrical Transport Properties of Amorphous Ox..:
Welk, A.
;
Reinhardt, A.
;
Herrfurth, O.
...
Physical Review Applied. 17 (2022) 2 - p. , 2022
Link:
https://doi.org/10.1103/physrevapplied.17.024007
RT Journal T1
Analysis of Electrical Transport Properties of Amorphous Oxide Semiconductors by an Extended Percolation-Based Random Band-Edge Model
UL https://suche.suub.uni-bremen.de/peid=cr-10.1103_physrevapplied.17.024007&Exemplar=1&LAN=DE A1 Welk, A. A1 Reinhardt, A. A1 Herrfurth, O. A1 Splith, D. A1 von Wenckstern, H. A1 Grundmann, M. PB American Physical Society (APS) YR 2022 SN 2331-7019 JF Physical Review Applied VO 17 IS 2 LK http://dx.doi.org/https://doi.org/10.1103/physrevapplied.17.024007 DO https://doi.org/10.1103/physrevapplied.17.024007 SF ELIB - SuUB Bremen
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