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1 Ergebnisse
1
Effect of Electrode Roughness on Electroforming inHfO2and D..:
Nandi, Sanjoy Kumar
;
Liu, Xinjun
;
Venkatachalam, Dinesh Kumar
.
Physical Review Applied. 4 (2015) 6 - p. , 2015
Link:
https://doi.org/10.1103/physrevapplied.4.064010
RT Journal T1
Effect of Electrode Roughness on Electroforming inHfO2and Defect-Induced Moderation of Electric-Field Enhancement
UL https://suche.suub.uni-bremen.de/peid=cr-10.1103_physrevapplied.4.064010&Exemplar=1&LAN=DE A1 Nandi, Sanjoy Kumar A1 Liu, Xinjun A1 Venkatachalam, Dinesh Kumar A1 Elliman, Robert Glen PB American Physical Society (APS) YR 2015 SN 2331-7019 JF Physical Review Applied VO 4 IS 6 LK http://dx.doi.org/https://doi.org/10.1103/physrevapplied.4.064010 DO https://doi.org/10.1103/physrevapplied.4.064010 SF ELIB - SuUB Bremen
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