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1 Ergebnisse
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H2*defect in crystalline silicon:
Holbech, J. D.
;
Bech Nielsen, B.
;
Jones, R.
..
Physical Review Letters. 71 (1993) 6 - p. 875-878 , 1993
Link:
https://doi.org/10.1103/physrevlett.71.875
RT Journal T1 <Title>H2*defect in crystalline silicon</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1103_physrevlett.71.875&Exemplar=1&LAN=DE A1 Holbech, J. D. A1 Bech Nielsen, B. A1 Jones, R. A1 Sitch, P. A1 Öberg, S. PB American Physical Society (APS) YR 1993 SN 0031-9007 JF Physical Review Letters VO 71 IS 6 SP 875 OP 878 LK http://dx.doi.org/https://doi.org/10.1103/physrevlett.71.875 DO https://doi.org/10.1103/physrevlett.71.875 SF ELIB - SuUB Bremen
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