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Electron Density Distribution in CaNi2Si2using Synchrotron ..:
Hansen, N. K.
;
Gavoille, G.
;
Welter, R.
...
Acta Crystallographica Section A Foundations of Crystallography. 56 (2000) s1 - p. s193-s193 , 2000
Link:
https://doi.org/10.1107/s0108767300024302
RT Journal T1 <Title>Electron Density Distribution in CaNi2Si2using Synchrotron X-ray Diffraction and First Principles Calculations</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s0108767300024302&Exemplar=1&LAN=DE A1 Hansen, N. K. A1 Gavoille, G. A1 Welter, R. A1 Malaman, B. A1 Herzig, P. A1 Krane, H.-G. PB International Union of Crystallography (IUCr) YR 2000 SN 0108-7673 JF Acta Crystallographica Section A Foundations of Crystallography VO 56 IS s1 SP s193 OP s193 LK http://dx.doi.org/https://doi.org/10.1107/s0108767300024302 DO https://doi.org/10.1107/s0108767300024302 SF ELIB - SuUB Bremen
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