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Combining Rietveld and reflectivity for thin film analysis:
Lutterotti, L.
;
Cont, L.
;
Gibaud, A.
...
Acta Crystallographica Section A Foundations of Crystallography. 58 (2002) s1 - p. c169-c169 , 2002
Link:
https://doi.org/10.1107/s0108767302091808
RT Journal T1 <Title>Combining Rietveld and reflectivity for thin film analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s0108767302091808&Exemplar=1&LAN=DE A1 Lutterotti, L. A1 Cont, L. A1 Gibaud, A. A1 Dekadjevi, D. A1 Wiemer, C. A1 Ricote, J. PB International Union of Crystallography (IUCr) YR 2002 SN 0108-7673 JF Acta Crystallographica Section A Foundations of Crystallography VO 58 IS s1 SP c169 OP c169 LK http://dx.doi.org/https://doi.org/10.1107/s0108767302091808 DO https://doi.org/10.1107/s0108767302091808 SF ELIB - SuUB Bremen
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