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Strain analysis using high energy X-ray white beam diffract..:
Korsunsky, A.
;
Liu, J.
;
Golshan, M.
Acta Crystallographica Section A Foundations of Crystallography. 61 (2005) a1 - p. c147-c147 , 2005
Link:
https://doi.org/10.1107/s0108767305093748
RT Journal T1 <Title>Strain analysis using high energy X-ray white beam diffraction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s0108767305093748&Exemplar=1&LAN=DE A1 Korsunsky, A. A1 Liu, J. A1 Golshan, M. PB International Union of Crystallography (IUCr) YR 2005 SN 0108-7673 JF Acta Crystallographica Section A Foundations of Crystallography VO 61 IS a1 SP c147 OP c147 LK http://dx.doi.org/https://doi.org/10.1107/s0108767305093748 DO https://doi.org/10.1107/s0108767305093748 SF ELIB - SuUB Bremen
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