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Real-time X-ray studies of the effect of chemical transient..:
Fuoss, P. H.
;
Highland, M. J.
;
Fister, T. T.
...
Acta Crystallographica Section A Foundations of Crystallography. 66 (2010) a1 - p. s97-s97 , 2010
Link:
https://doi.org/10.1107/s0108767310097916
RT Journal T1 <Title>Real-time X-ray studies of the effect of chemical transients on oxide thin-film surface structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s0108767310097916&Exemplar=1&LAN=DE A1 Fuoss, P. H. A1 Highland, M. J. A1 Fister, T. T. A1 Hruszkewycz, S. O. A1 Richard, M. -I. A1 Fong, D. D. A1 Eastman, J. A. A1 Thompson, Carol A1 Streiffer, S. K. A1 Stephenson, G. B. PB International Union of Crystallography (IUCr) YR 2010 SN 0108-7673 JF Acta Crystallographica Section A Foundations of Crystallography VO 66 IS a1 SP s97 OP s97 LK http://dx.doi.org/https://doi.org/10.1107/s0108767310097916 DO https://doi.org/10.1107/s0108767310097916 SF ELIB - SuUB Bremen
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