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Versatility of a hard X-ray Kirkpatrick–Baez focus characte..:
Giewekemeyer, Klaus
;
Wilke, Robin N.
;
Osterhoff, Markus
...
Journal of Synchrotron Radiation. 20 (2013) 3 - p. 490-497 , 2013
Link:
https://doi.org/10.1107/s0909049513005372
RT Journal T1 <Title>Versatility of a hard X-ray Kirkpatrick–Baez focus characterized by ptychography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s0909049513005372&Exemplar=1&LAN=DE A1 Giewekemeyer, Klaus A1 Wilke, Robin N. A1 Osterhoff, Markus A1 Bartels, Matthias A1 Kalbfleisch, Sebastian A1 Salditt, Tim PB International Union of Crystallography (IUCr) YR 2013 SN 0909-0495 JF Journal of Synchrotron Radiation VO 20 IS 3 SP 490 OP 497 LK http://dx.doi.org/https://doi.org/10.1107/s0909049513005372 DO https://doi.org/10.1107/s0909049513005372 SF ELIB - SuUB Bremen
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