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Combinatorial refinement of thin-film microstructure, prope..:
Zalesak, J.
;
Todt, J.
;
Pitonak, R.
...
Journal of Applied Crystallography. 49 (2016) 6 - p. 2217-2225 , 2016
Link:
https://doi.org/10.1107/s1600576716017258
RT Journal T1 <Title>Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s1600576716017258&Exemplar=1&LAN=DE A1 Zalesak, J. A1 Todt, J. A1 Pitonak, R. A1 Köpf, A. A1 Weißenbacher, R. A1 Sartory, B. A1 Burghammer, M. A1 Daniel, R. A1 Keckes, J. PB International Union of Crystallography (IUCr) YR 2016 SN 1600-5767 JF Journal of Applied Crystallography VO 49 IS 6 SP 2217 OP 2225 LK http://dx.doi.org/https://doi.org/10.1107/s1600576716017258 DO https://doi.org/10.1107/s1600576716017258 SF ELIB - SuUB Bremen
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