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Fast fitting of reflectivity data of growing thin films usi..:
Greco, Alessandro
;
Starostin, Vladimir
;
Karapanagiotis, Christos
...
Journal of Applied Crystallography. 52 (2019) 6 - p. 1342-1347 , 2019
Link:
https://doi.org/10.1107/s1600576719013311
RT Journal T1
Fast fitting of reflectivity data of growing thin films using neural networks
UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s1600576719013311&Exemplar=1&LAN=DE A1 Greco, Alessandro A1 Starostin, Vladimir A1 Karapanagiotis, Christos A1 Hinderhofer, Alexander A1 Gerlach, Alexander A1 Pithan, Linus A1 Liehr, Sascha A1 Schreiber, Frank A1 Kowarik, Stefan PB International Union of Crystallography (IUCr) YR 2019 SN 1600-5767 JF Journal of Applied Crystallography VO 52 IS 6 SP 1342 OP 1347 LK http://dx.doi.org/https://doi.org/10.1107/s1600576719013311 DO https://doi.org/10.1107/s1600576719013311 SF ELIB - SuUB Bremen
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