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1 Ergebnisse
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Characterizing the intrinsic properties of individual XFEL ..:
Lee, Heemin
;
Shin, Jaeyong
;
Cho, Do Hyung
...
Journal of Synchrotron Radiation. 27 (2020) 1 - p. 17-24 , 2020
Link:
https://doi.org/10.1107/s1600577519015443
RT Journal T1
Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction
UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s1600577519015443&Exemplar=1&LAN=DE A1 Lee, Heemin A1 Shin, Jaeyong A1 Cho, Do Hyung A1 Jung, Chulho A1 Sung, Daeho A1 Ahn, Kangwoo A1 Nam, Daewoong A1 Kim, Sangsoo A1 Kim, Kyung Sook A1 Park, Sang-Yeon A1 Fan, Jiadong A1 Jiang, Huaidong A1 Kang, Hyun Chol A1 Tono, Kensuke A1 Yabashi, Makina A1 Ishikawa, Tetsuya A1 Noh, Do Young A1 Song, Changyong PB International Union of Crystallography (IUCr) YR 2020 SN 1600-5775 JF Journal of Synchrotron Radiation VO 27 IS 1 SP 17 OP 24 LK http://dx.doi.org/https://doi.org/10.1107/s1600577519015443 DO https://doi.org/10.1107/s1600577519015443 SF ELIB - SuUB Bremen
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