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Beam damage of single semiconductor nanowires during X-ray ..:
Pietsch, Ullrich
;
AlHassan, Ali
;
Davtyan, Arman
..
Acta Crystallographica Section A Foundations and Advances. 75 (2019) a2 - p. e655-e655 , 2019
Link:
https://doi.org/10.1107/s2053273319089010
RT Journal T1 <Title>Beam damage of single semiconductor nanowires during X-ray nano-beam diffraction experiments</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s2053273319089010&Exemplar=1&LAN=DE A1 Pietsch, Ullrich A1 AlHassan, Ali A1 Davtyan, Arman A1 Bahrami, Danial A1 Bertram, Florian PB International Union of Crystallography (IUCr) YR 2019 SN 2053-2733 JF Acta Crystallographica Section A Foundations and Advances VO 75 IS a2 SP e655 OP e655 LK http://dx.doi.org/https://doi.org/10.1107/s2053273319089010 DO https://doi.org/10.1107/s2053273319089010 SF ELIB - SuUB Bremen
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