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Quantification of the strain-relaxation processes in silico..:
Romanitan, Cosmin
;
Kusko, Mihaela
;
Popescu, Marian
...
Acta Crystallographica Section A Foundations and Advances. 75 (2019) a2 - p. e653-e653 , 2019
Link:
https://doi.org/10.1107/s2053273319089034
RT Journal T1 <Title>Quantification of the strain-relaxation processes in silicon nanowire arrays using combined X-ray diffraction analyses</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1107_s2053273319089034&Exemplar=1&LAN=DE A1 Romanitan, Cosmin A1 Kusko, Mihaela A1 Popescu, Marian A1 Varasteanu, Pericle A1 Radoi, Antonio A1 Pachiu, Cristina PB International Union of Crystallography (IUCr) YR 2019 SN 2053-2733 JF Acta Crystallographica Section A Foundations and Advances VO 75 IS a2 SP e653 OP e653 LK http://dx.doi.org/https://doi.org/10.1107/s2053273319089034 DO https://doi.org/10.1107/s2053273319089034 SF ELIB - SuUB Bremen
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