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Analysis of photometric properties of occluding edges by th..:
Asada, N.
;
Fujiwara, H.
;
Matsuyama, T.
IEEE Transactions on Pattern Analysis and Machine Intelligence. 20 (1998) 2 - p. 155-167 , 1998
Link:
https://doi.org/10.1109/34.659933
RT Journal T1 <Title>Analysis of photometric properties of occluding edges by the reversed projection blurring model</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_34.659933&Exemplar=1&LAN=DE A1 Asada, N. A1 Fujiwara, H. A1 Matsuyama, T. PB Institute of Electrical and Electronics Engineers (IEEE) YR 1998 SN 0162-8828 JF IEEE Transactions on Pattern Analysis and Machine Intelligence VO 20 IS 2 SP 155 OP 167 LK http://dx.doi.org/https://doi.org/10.1109/34.659933 DO https://doi.org/10.1109/34.659933 SF ELIB - SuUB Bremen
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