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1 Ergebnisse
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Contour matching using epipolar geometry:
Joon Hee Han
;
Jong Seung Park
IEEE Transactions on Pattern Analysis and Machine Intelligence. 22 (2000) 4 - p. 358-370 , 2000
Link:
https://doi.org/10.1109/34.845378
RT Journal T1 <Title>Contour matching using epipolar geometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_34.845378&Exemplar=1&LAN=DE A1 Joon Hee Han A1 Jong Seung Park PB Institute of Electrical and Electronics Engineers (IEEE) YR 2000 SN 0162-8828 JF IEEE Transactions on Pattern Analysis and Machine Intelligence VO 22 IS 4 SP 358 OP 370 LK http://dx.doi.org/https://doi.org/10.1109/34.845378 DO https://doi.org/10.1109/34.845378 SF ELIB - SuUB Bremen
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