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1 Ergebnisse
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Multiple Controlled Antirandom Testing (MCAT) for High Faul..:
Alamgir, Arbab
;
Khari Bin A'Ain, Abu
;
Sheikh, Usman Ullah
...
IEEE Access. 7 (2019) - p. 117246-117257 , 2019
Link:
https://doi.org/10.1109/access.2019.2937113
RT Journal T1
Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2019.2937113&Exemplar=1&LAN=DE A1 Alamgir, Arbab A1 Khari Bin A'Ain, Abu A1 Sheikh, Usman Ullah A1 Paraman, Norlina A1 Mokji, Musa Mohd A1 Grout, Ian PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 2169-3536 JF IEEE Access VO 7 SP 117246 OP 117257 LK http://dx.doi.org/https://doi.org/10.1109/access.2019.2937113 DO https://doi.org/10.1109/access.2019.2937113 SF ELIB - SuUB Bremen
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