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1 Ergebnisse
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Mechanism and Method for Outer Raceway Defect Localization ..:
Zhang, Feibin
;
Huang, Jinfeng
;
Chu, Fulei
.
IEEE Access. 8 (2020) - p. 4351-4360 , 2020
Link:
https://doi.org/10.1109/access.2019.2950284
RT Journal T1
Mechanism and Method for Outer Raceway Defect Localization of Ball Bearings
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2019.2950284&Exemplar=1&LAN=DE A1 Zhang, Feibin A1 Huang, Jinfeng A1 Chu, Fulei A1 Cui, Lingli PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 2169-3536 JF IEEE Access VO 8 SP 4351 OP 4360 LK http://dx.doi.org/https://doi.org/10.1109/access.2019.2950284 DO https://doi.org/10.1109/access.2019.2950284 SF ELIB - SuUB Bremen
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