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1 Ergebnisse
1
Unscrambling for Subgap Density-of-States in Multilayered M..:
Yang, Ga Won
;
Seo, Seung Gi
;
Choi, Sungju
..
IEEE Access. 9 (2021) - p. 73090-73102 , 2021
Link:
https://doi.org/10.1109/access.2021.3081095
RT Journal T1
Unscrambling for Subgap Density-of-States in Multilayered MoS2Field Effect Transistors under DC Bias Stress via Optical Charge-Pumping Capacitance-Voltage Spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2021.3081095&Exemplar=1&LAN=DE A1 Yang, Ga Won A1 Seo, Seung Gi A1 Choi, Sungju A1 Kim, Dae Hwan A1 Jin, Sung Hun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2169-3536 JF IEEE Access VO 9 SP 73090 OP 73102 LK http://dx.doi.org/https://doi.org/10.1109/access.2021.3081095 DO https://doi.org/10.1109/access.2021.3081095 SF ELIB - SuUB Bremen
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