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1 Ergebnisse
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Drain Induced Barrier Widening and Reverse Short Channel Ef..:
Ram, Mamidala Karthik
;
Tiwari, Neha
;
Abdi, Dawit Burusie
.
IEEE Access. 9 (2021) - p. 150366-150372 , 2021
Link:
https://doi.org/10.1109/access.2021.3125856
RT Journal T1
Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2021.3125856&Exemplar=1&LAN=DE A1 Ram, Mamidala Karthik A1 Tiwari, Neha A1 Abdi, Dawit Burusie A1 Saurabh, Sneh PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2169-3536 JF IEEE Access VO 9 SP 150366 OP 150372 LK http://dx.doi.org/https://doi.org/10.1109/access.2021.3125856 DO https://doi.org/10.1109/access.2021.3125856 SF ELIB - SuUB Bremen
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