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1 Ergebnisse
1
Single-Trace Attack on NIST Round 3 Candidate Dilithium Usi..:
Han, Jaeseung
;
Lee, Taeho
;
Kwon, Jihoon
...
IEEE Access. 9 (2021) - p. 166283-166292 , 2021
Link:
https://doi.org/10.1109/access.2021.3135600
RT Journal T1
Single-Trace Attack on NIST Round 3 Candidate Dilithium Using Machine Learning-Based Profiling
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2021.3135600&Exemplar=1&LAN=DE A1 Han, Jaeseung A1 Lee, Taeho A1 Kwon, Jihoon A1 Lee, Joohee A1 Kim, Il-Ju A1 Cho, Jihoon A1 Han, Dong-Guk A1 Sim, Bo-Yeon PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2169-3536 JF IEEE Access VO 9 SP 166283 OP 166292 LK http://dx.doi.org/https://doi.org/10.1109/access.2021.3135600 DO https://doi.org/10.1109/access.2021.3135600 SF ELIB - SuUB Bremen
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