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1 Ergebnisse
1
High-Efficiency and High-Reliability Deep-UV Light-Emitting..:
Park, Tae Hoon
;
Son, Kyung Rock
;
Hirayama, Hideki
.
IEEE Access. 9 (2021) - p. 166617-166623 , 2021
Link:
https://doi.org/10.1109/access.2021.3136351
RT Journal T1
High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using Transparent Ni-Implanted AlN Ohmic Electrodes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2021.3136351&Exemplar=1&LAN=DE A1 Park, Tae Hoon A1 Son, Kyung Rock A1 Hirayama, Hideki A1 Kim, Tae Geun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2169-3536 JF IEEE Access VO 9 SP 166617 OP 166623 LK http://dx.doi.org/https://doi.org/10.1109/access.2021.3136351 DO https://doi.org/10.1109/access.2021.3136351 SF ELIB - SuUB Bremen
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