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1 Ergebnisse
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Lifetime Prediction of Current-and Temperature-Induced Degr..:
Herzog, Alexander
;
Benkner, Simon
;
Zandi, Babak
...
IEEE Access. 11 (2023) - p. 19928-19940 , 2023
Link:
https://doi.org/10.1109/access.2023.3249478
RT Journal T1
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2023.3249478&Exemplar=1&LAN=DE A1 Herzog, Alexander A1 Benkner, Simon A1 Zandi, Babak A1 Buffolo, Matteo A1 Van Driel, Willem D. A1 Meneghini, Matteo A1 Khanh, Tran Quoc PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2169-3536 JF IEEE Access VO 11 SP 19928 OP 19940 LK http://dx.doi.org/https://doi.org/10.1109/access.2023.3249478 DO https://doi.org/10.1109/access.2023.3249478 SF ELIB - SuUB Bremen
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