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1 Ergebnisse
1
Fuzzability Testing Framework for Incomplete Firmware Binar:
Jang, Jiwon
;
Son, Gyeongjin
;
Lee, Hyeonsu
...
IEEE Access. 11 (2023) - p. 77608-77619 , 2023
Link:
https://doi.org/10.1109/access.2023.3297888
RT Journal T1
Fuzzability Testing Framework for Incomplete Firmware Binary
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2023.3297888&Exemplar=1&LAN=DE A1 Jang, Jiwon A1 Son, Gyeongjin A1 Lee, Hyeonsu A1 Yun, Heesun A1 Kim, Deokjin A1 Lee, Sangwook A1 Kim, Seongmin A1 Jang, Daehee PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2169-3536 JF IEEE Access VO 11 SP 77608 OP 77619 LK http://dx.doi.org/https://doi.org/10.1109/access.2023.3297888 DO https://doi.org/10.1109/access.2023.3297888 SF ELIB - SuUB Bremen
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