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1 Ergebnisse
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A Toolchain to Quantify Burn-In Stress Effectiveness on Lar..:
Angione, Francesco
;
Appello, Davide
;
Bernardi, Paolo
...
IEEE Access. 11 (2023) - p. 105655-105676 , 2023
Link:
https://doi.org/10.1109/access.2023.3316511
RT Journal T1
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2023.3316511&Exemplar=1&LAN=DE A1 Angione, Francesco A1 Appello, Davide A1 Bernardi, Paolo A1 Calabrese, Andrea A1 Quer, Stefano A1 Reorda, Matteo Sonza A1 Tancorre, Vincenzo A1 Ugioli, Roberto PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2169-3536 JF IEEE Access VO 11 SP 105655 OP 105676 LK http://dx.doi.org/https://doi.org/10.1109/access.2023.3316511 DO https://doi.org/10.1109/access.2023.3316511 SF ELIB - SuUB Bremen
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