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1 Ergebnisse
1
A Pragmatic Model to Predict Future Device Aging:
Brown, James
;
Tok, Kean Hong
;
Gao, Rui
...
IEEE Access. 11 (2023) - p. 127725-127736 , 2023
Link:
https://doi.org/10.1109/access.2023.3329077
RT Journal T1
A Pragmatic Model to Predict Future Device Aging
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2023.3329077&Exemplar=1&LAN=DE A1 Brown, James A1 Tok, Kean Hong A1 Gao, Rui A1 Ji, Zhigang A1 Zhang, Weidong A1 Marsland, John S. A1 Chiarella, Thomas A1 Franco, Jacopo A1 Kaczer, Ben A1 Linten, Dimitri A1 Zhang, Jian Fu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2169-3536 JF IEEE Access VO 11 SP 127725 OP 127736 LK http://dx.doi.org/https://doi.org/10.1109/access.2023.3329077 DO https://doi.org/10.1109/access.2023.3329077 SF ELIB - SuUB Bremen
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