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1 Ergebnisse
1
Trustworthy Integrated Circuits: From Safety to Security an..:
Rama, Enkele
;
Ayache, Mouadh
;
Buchty, Rainer
...
IEEE Access. 12 (2024) - p. 69603-69632 , 2024
Link:
https://doi.org/10.1109/access.2024.3400685
RT Journal T1
Trustworthy Integrated Circuits: From Safety to Security and Beyond
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_access.2024.3400685&Exemplar=1&LAN=DE A1 Rama, Enkele A1 Ayache, Mouadh A1 Buchty, Rainer A1 Bauer, Bernhard A1 Korb, Matthias A1 Berekovic, Mladen A1 Mulhem, Saleh PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2169-3536 JF IEEE Access VO 12 SP 69603 OP 69632 LK http://dx.doi.org/https://doi.org/10.1109/access.2024.3400685 DO https://doi.org/10.1109/access.2024.3400685 SF ELIB - SuUB Bremen
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