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API Tests for RAM Chips:
Srini, V.P.
Computer. 10 (1977) 7 - p. 32-35 , 1977
Link:
https://doi.org/10.1109/c-m.1977.217778
RT Journal T1 <Title>API Tests for RAM Chips</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_c-m.1977.217778&Exemplar=1&LAN=DE A1 Srini, V.P. PB Institute of Electrical and Electronics Engineers (IEEE) YR 1977 SN 0018-9162 SN 1558-0814 JF Computer VO 10 IS 7 SP 32 OP 35 LK http://dx.doi.org/https://doi.org/10.1109/c-m.1977.217778 DO https://doi.org/10.1109/c-m.1977.217778 SF ELIB - SuUB Bremen
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