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Design and Test of the In-Array Build-In Self-Test Scheme f..:

Cui, Xiaole ; Zhang, Miaomiao ; Lin, Qiujun..
IEEE Journal of the Electron Devices Society.  7 (2019)  - p. 1007-1012 , 2019
Link: https://doi.org/10.1109/jeds.2019.2931757