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Investigation on Metal–Oxide Graphene Field-Effect Transist..:
Giambra, Marco A.
;
Benz, Christian
;
Wu, Fan
...
IEEE Journal of the Electron Devices Society. 7 (2019) - p. 964-968 , 2019
Link:
https://doi.org/10.1109/jeds.2019.2939574
RT Journal T1 <Title>Investigation on Metal–Oxide Graphene Field-Effect Transistors With Clamped Geometries</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2019.2939574&Exemplar=1&LAN=DE A1 Giambra, Marco A. A1 Benz, Christian A1 Wu, Fan A1 Thurmer, Maximillian A1 Balachandran, Geethu A1 Benfante, Antonio A1 Pernice, Riccardo A1 Pandey, Himadri A1 Boopathi, Muraleetharan A1 Jang, Min-Ho A1 Ahn, Jong-Hyun A1 Stivala, Salvatore A1 Calandra, Enrico A1 Arnone, Claudio A1 Cusumano, Pasquale A1 Busacca, Alessandro A1 Pernice, Wolfram H. P. A1 Danneau, Romain PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 7 SP 964 OP 968 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2019.2939574 DO https://doi.org/10.1109/jeds.2019.2939574 SF ELIB - SuUB Bremen
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